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S. Aggarwal, S. Paul, D. Massey, and D. Caldararu
S. Aggarwal, S. Paul, D. Massey, and D. Caldararu
H. Agrawal, J. L. Alberi, J. R. Horgan, J. J. Li, S. London, W. E. Wong, S. Ghosh,and N. Wilde
    "Mining System Tests to Aid Software Maintenence," 1998.
    Appeared in (journal): IEEE Computer, Volume 31(7)
W. K. Al-Assadi, A. P. Jayasumana, and Y. K. Malaiya
    "A Bipartite Differential IDDQ Testable Static RAM Design," 1995.
    Appeared in (conference): International Workshop on Memory Tech. Design and Testing, Page(s) 36-41

    Available at: Al-Assadi-malaiya-p-alassadi95.pdf (pdf)

W. K. Al-Assadi, Y. K. Malaiya, and A. P. Jayasumana
    "Differential IDDQ Testable Static RAM Architecture," 1995.
    Appeared in (conference): IEEE International Workshop on IDDQ Testing, Page(s) 54-59
W. K. Al-Assadi, D. Lu, A. P. Jayasumana, Y. K. Malaiya, and C. Q. Tong
    "Data Feed-through Faults in circuits using Unclocked Storage Elements," 1994.
    Appeared in (journal): Electronic Letters, Volume 30(10), Page(s) 764-765

    Available at: Al-Assadi-malaiya-p-alassadi94feed.pdf (pdf)

W. K. Al-Assadi, A. P. Jayasumana, and Y. K. Malaiya
    "On Fault Modeling and Testing of Content Addressable Memories," 1994.
    Appeared in (conference): International Memory Tech. Design and Test Workshop, Page(s) 78-83
Waleed K. Al-Assadi, Anura P. Jayasumana, and Yashwant K. Malaiya
W. K. Al-Assadi, A. P. Jayasumana, and Y. K. Malaiya
Waleed K. Al-Assadi, Ding Lu, Anura P. Jayasumana, Yashwant K. Malaiya, and Carol Q. Tong
W. K. Al-Assadi, Y. K. Malaiya, and A. P. Jayasumana
Waleed K. Al-Assadi, Yashwant K. Malaiya, and Anura P. Jayasumana
Waleed K. Al-Assadi, Ding Lu, Carol Q. Tong, Anura P. Jayasumana, and Yashwant K. Malaiya
W. Alassadi, Y. K. Malaiya, and A. P. Jayasumana
    "Faulty Behavior of Storage Elements and its Effects on Sequential CircuitsI," 1993.
    Appeared in (journal): EEE Transactions on VLSI Systems, Page(s) 446-452

    Available at: Alassadi-malaiya-p-alassaditrans.pdf (pdf)

W. K. Alassadi, Y. K. Malaiya, and A. P. Jayasumana
    "Modeling of Intra-Cell Defects in CMOS SRAM," 1993.
    Appeared in (conference): IEEE International Workshop on Memory Testing, Page(s) 78-81

    Available at: Alassadi-malaiya-p-alassadi93.pdf (pdf)

W. K. Alassadi, Ding Lu, A. P. Jayasumana, Y. K. Malaiya, and C. Tong
    "Faulty Behavior of Asynchronous Storage Elements," 1993.
    Appeared in (conference): 5th NASA Symposium on VLSI Design, Page(s) 7.4.1-7.4.9
W. Alassadi, Y. K. Malaiya, and A. P. Jayasumana
    "Use of Storage Elements as Primitives for Testing Sequential Circuits," 1993.
    Appeared in (conference): 6th International Conference on VLSI Design, Page(s) 118-123
W. Alassadi, Y. K. Malaiya, and A. P. Jayasumana
    "Detection of Feed-Through Faults in CMOS Storage Elements," 1992.
    Appeared in (conference): 4th NASA Symposium on VLSI Design, Page(s) 7.2.1-7.2.5
R. Alexander, J. Bieman, and R. France
    "A Software Engineering Research Repository," 2004.
    Appeared in (conference): Workshop on Empirical Rsearch in Software Testing (WERST 2004)

    Available at: Alexander-bieman-Pubs-WERST2004.pdf (pdf)

R Alexander, J. Bieman, S. Ghosh, and B. Ji
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