Fault-Tolerant Computing CS-680

Y.K Malaiya

Conference Proceedings

• International Symposium on Software Reliability Engineering (ISSRE)
• International Symposium on Fault-tolerant Computing (FTCS)
• International Test Conference (ITC)
• Asian Test Symposium
• Design Automation Conference (DAC)
• Int. Conference on Computer Design (ICCD)
• Int. Conf. on Computer-Aided Design (ICCAD)
• COMPSAC
• Int. Symp. Microarchitecture (MICRO)
• Int. Conf. on Software Engineering (ICSE)
• Int. Symp. VLSI Design
• VLSI Test Symposium
• Autotestcon
• Several others depending on your areas of interest.

Periodicals

• IEEE Trans. Computers
• IEEE Trans. Reliability
• IEEE Design and Test
• IEEE Trans. CAD
• IEEE Trans. Software Engineering
• IEEE Software
• IEEE Micro
• Microelectronics and Reliability
• Bell Systems Tech. Journal
• IBM Journal of Development and Research
• IEEE Computer
• IEE Proc. (Computers and Digital)
• Electronic Design
• Computer Design
• Proc. of IEEE (special issues)
• JETTA
• Others

Books

• Lyu: Handbook on Software Reliability Engineering, McGraw-Hill
• Lala: Fault tolerant and Fault Testable Digital Design (Prentice hall)
• Abramovichi, Breuer and Friedman: Digital Systems: Testing and Testable Design (CS Press)
• Rajsuman: Digital Hardware Testing (Artech House)
• Malaiya and Rajsuman (Ed.):Bridging Faults and IDDQ Testing (IEEE CS Press, Oct.)
• Siewiorek and Swartz: The Theory and Practice of Reliable System Design (Digital Press)
• Malaiya and Srimani (Ed): Software Reliability Models (IEEE CS Press)
• Musa, Ianino and Okumoto: Software Reliability (McGraw Hill)
• Johnson: Design and Analysis of Fault Tolerant Digital Systems (Addison Wesley)
• Pradhan (Ed): Fault Tolerant Computing (2 volumes)
• Nelson and Carroll (Ed): Tutorial: Fault Tolerant Computing (IEEE CS Press)
• Agrawal and Seth (Ed): Tutorial: Test Generation for VLSI Chips (IEEE CS Press)
• Shooman: Probabilistic Reliability (McGraw-Hill)
• Beizer: Software Testing Techniques (Van Nostrand)
• Bardell et al: Built-in test for VLSI (Wiley)
• Dhillon: Reliability in Computer System Design (Ablex)
• Friedman and Menon: Fault-Diagnosis in Digital Systems
• Pierce: Failure Tolerant Computer Design (ancient!)
• Chang, Manning and Metze: Fault-diagnosis of digital systems
• Anderson and Lee: Fault-tolerance principles and practices
• Kraft and Toy: Microprogrammed control and reliable design

CSU Library

• SAGE -- online public access catalog
• Electronic Resources in Computer Science